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Transport properties in chromium-doped Ti2O3 thin films

Wang, Zhenjun
Tang, Jinke
Spinu, Leonard
Abstract
Description
In this paper, we report the transport properties of Cr-doped Ti2O3 thin films. The thin films were grown on α-Al2O3 s012d substrates by pulsed-laser deposition. X-ray diffraction and transmission electron microscopy results show that the films are single corundum phase. All of (CrxTi1−x)2O3 show semiconducting behavior. Without doping, pure Ti2O3 thin films show positive magnetoresistance (MR) of 23% at 2 K. The MR behavior changed dramatically after doping with Cr. Sample (Cr0.1Ti0.9)2O3 shows MR=−360% at 2 K. All of the Cr-doped films are ferromagnetic up to room temperature.
Date
2005-05-06
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Publisher
University of Wyoming. Libraries